Please click here to download the CN6000 pdf brochure.
Together with a leading manufacturer of Scanning Probe Microscopes (SPMs), we have been developing the CN6000 SPM. This is a highly capable yet affordable AFM system which integrates the ability to perform STM (Scanning tunneling microscopy), and AFM (Atomic Force Microscopy) with a wide range of imaging and measurement modes available. The AFM can operate in contact mode, dynamic mode and in air or liquid.
There are a wide range of accessories available for the microscope, including different scanners (There are 7 scanners available from1.5 microns for high resolution imaging to 100 microns for large-area imaging). The scanners are easily interchangeable. This is a sample-scanning system so does not fall prey to the instabilities associated with tip-scanning microscopes where the optics do not always scan correctly with the tip.
The microscope comes complete with passive vibration isolation, and an optical viewing system can be supplied.
To find out more or to arrange a demonstration, please contact us at info@cambridgenano.co.uk