Please click here to download the CN5000 pdf brochure.
The CN5000 Scanning Probe Microscope is our entry-level Research-grade yet highly capable microscope system which integrates the ability to perform STM (Scanning tunneling microscopy), and AFM (Atomic Force Microscopy), all in a highly- affordable AFM package. The AFM can operate in contact mode and dynamic mode. We have developed this microscope keeping in mind that many users have a tight budget, and do not need many of the measurement functions of high-end systems, while retaining the ability to obtain high-quality, publication-ready data using the most common measurement and imaging modes that are the industry standard.
There are a wide range of accessories available for the microscope, including different scanners (2 micron scanner for high resolution work and a 20 micron scanner for large-area imaging). The scanners are easily interchangeable.
The microscope comes complete with passive vibration isolation, and an optical viewing system can be supplied.
To find out more, please contact us at info@cambridgenano.co.uk